Scanning Probe Microscope (SPM)
| Project Number | CN20100209008 |
| Project Name | Scanning Probe Microscope (SPM) |
| Transfer Proportion(%) | -- |
| Price | 5(M RMB) |
| Publication Period | 2010-02-06 - 2011-02-09 |
| Industry | technology |
| Region | |
| Profile | The invention provides a kind of scanning probe microscope (SPM) that can effective prevent scuff of sample products, but also reduce distortion of images, so as to get high-resolution images that can accurately present appearance of surface of sample products, including pinpoint micro cantilever. Features are as follows: the aforesaid micro cantilever is connected with vibration device. The pinpoint is on one end of the micro cantilever. The vibration device is on the other end of the micro cantilever. The vibration device includes piezoelectric ceramics crystals and vibration frequency controller that controls vibration frequency and vibration amplitude. The micro cantilever is fixed on the aforesaid piezoelectric ceramics crystals.Project planning:A high-tech company will be established based on SPM products, with clear property right, complete system and capable talents in two years. The company will be adaptable to the market, occupy certain shares in domestic market, be dedicated to development of scientific instrument undertaking and will have certain sustainable development ability. Cooperation method:Financing scale: five million yuan, controlling shares |
| Contact | |
| From | CTEX |